Hierarchical/decomposition techniques for large-scale analogue diagnosis

Peter R Shepherd

Research output: Chapter or section in a book/report/conference proceeding › Book chapter

Original language	English
Title of host publication	Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits: the system on chip approach
Editors	Y Sun
Publisher	IET
Pages	113-139
Number of pages	27
ISBN (Print)	978-0-86341-745-0
Publication status	Published - 2008

Cite this

@inbook{bfbc9d55b73247a0adf2385ffbcd7f28,

title = "Hierarchical/decomposition techniques for large-scale analogue diagnosis",

author = "Shepherd, {Peter R}",

year = "2008",

language = "English",

isbn = "978-0-86341-745-0",

pages = "113--139",

editor = "Y Sun",

booktitle = "Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits: the system on chip approach",

publisher = "IET",

}