Giant birefringence in anisotropically nanostructured silicon

N Kunzner, D Kovalev, J Diener, E Gross, V Y Timoshenko, G Polisski, F Koch, M Fujii

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Abstract

We performed a study of the in-plane birefringence of anisotropically nanostructured Si layers, which exhibit a greater difference in the main value of the anisotropic refractive index than that of natural birefringent crystals. The anisotropy parameters were found to be strongly dependent on the typical size of the Si nanowires used to assemble the layers. This finding opens the possibility of an application of birefringent Si retarders to a wide spectral range for control of the polarization state of light. (C) 2001 Optical Society of America.
Original languageEnglish
Pages (from-to)1265-1267
Number of pages3
JournalOptics Letters
Volume26
Issue number16
Publication statusPublished - 2001

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    Kunzner, N., Kovalev, D., Diener, J., Gross, E., Timoshenko, V. Y., Polisski, G., Koch, F., & Fujii, M. (2001). Giant birefringence in anisotropically nanostructured silicon. Optics Letters, 26(16), 1265-1267.