Gaussian beam profile and single transverse mode emission from previously multi-mode gain guided VCSELs using novel etch

L. M A Plouzennec, L. J. Sargent, R. V. Penty, I. H. White, P. J. Heard, M. R T Tan, S. W. Corzine, S. Y. Wang

Research output: Contribution to journalConference article

5 Citations (Scopus)

Abstract

A simple model is used to design and optimize masks that when etched onto the aperture of a normally multi-mode gain guided vertical-cavity surface-emitting laser, VCSEL, cause the device to lase in a single transverse mode. After etching, Gaussian beam profiles for the LP01 mode are achieved over the entire operating current range with greater than 16 dB modal suppression. To date single mode emission at 2 mW has been achieved with pinning of the nearfield width. The modelling shows that the etching introduces a spatial filter on the higher order modes. The power in the fundamental mode remains constant before and after etching.

Original languageEnglish
Pages (from-to)219-229
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3946
Publication statusPublished - 3 Dec 2000
EventVertical-Cavity Surface-Emitting Lasers IV - San Jose, CA, USA
Duration: 26 Jan 200028 Jan 2000

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Plouzennec, L. M. A., Sargent, L. J., Penty, R. V., White, I. H., Heard, P. J., Tan, M. R. T., Corzine, S. W., & Wang, S. Y. (2000). Gaussian beam profile and single transverse mode emission from previously multi-mode gain guided VCSELs using novel etch. Proceedings of SPIE - The International Society for Optical Engineering, 3946, 219-229.