Formation of mesophase surfactant-templated silica thin films from acidic solutions

K J Edler, T Brennan, C Fernandez-Martin, S J Roser

Research output: Chapter or section in a book/report/conference proceedingChapter or section

2 Citations (SciVal)


The formation of mesophase silica-surfactant thin films at the air/solution interface has been studied in situ using off-specular X-ray reflectivity, Brewster angle microscopy and small angle scattering. Results for cetyltrimethylammonium bromide-templated films suggest that the formation mechanism is strongly dependent on the silica:surfactant ratio, and this is confirmed by studies on the subphase solutions using time-resolved small angle X-ray and neutron scattering. Results of similar investigations for films templated with Pluronic((R)) P123 triblock copolymer surfactant also show a strong dependence of mesostructure development oil silica:surfactant ratio. A general formation mechanism for mesophase growth and thin film development is proposed.
Original languageEnglish
Title of host publicationRecent Advances in the Science and Technology of Zeolites and Related Materials, Pts a - C
Number of pages7
Publication statusPublished - 2004

Publication series

NameStudies in Surface Science and Catalysis


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