Focused ion beam etching of GaN

C. Flierl, I. H. White, M. Kuball, P. J. Heard, G. C. Allen, C. Marinelli, J. M. Rorison, R. V. Penty, Y. Chen, S. Y. Wang

Research output: Contribution to journalConference articlepeer-review

Fingerprint

Dive into the research topics of 'Focused ion beam etching of GaN'. Together they form a unique fingerprint.

Material Science