Abstract
The half-leaky guided mode technique for quantifying thin optical layers is here combined with a data fitting routine based on a genetic algorithm to provide an immensely powerful procedure for detailing the director profile in liquid crystal cells. This approach not only provides a full description of the optical parameters of the cell, but also gives quantitative uncertainties in these parameters. It is tested here, first by fitting to theoretically produced data and then applied to real experimental data.
Original language | English |
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Pages (from-to) | 301-307 |
Number of pages | 7 |
Journal | Liquid Crystals |
Volume | 22 |
Issue number | 3 |
DOIs | |
Publication status | Published - 31 Dec 1997 |
Funding
The authors acknowledge the support of EPSRC and Sharp Laboratories of Europe through a CASE award.
Funders | Funder number |
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Sharp Laboratories of Europe Ltd. | |
Center for Advanced Systems and Engineering, Syracuse University | |
Engineering and Physical Sciences Research Council |
ASJC Scopus subject areas
- General Chemistry
- General Materials Science
- Condensed Matter Physics