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Abstract
The use of etched nanorods from a planar template as a growth scaffold for a highly regular GaN/InGaN/GaN core-shell structure is demonstrated. The recovery of m-plane non-polar facets from etched high-aspect-ratio GaN nanorods is studied with and without the introduction of a hydrogen silsesquioxane passivation layer at the bottom of the etched nanorod arrays. This layer successfully prevented c-plane growth between the nanorods, resulting in vertical nanorod sidewalls (∼89.8°) and a more regular height distribution than re-growth on unpassivated nanorods. The height variation on passivated nanorods is solely determined by the uniformity of nanorod diameter, which degrades with increased growth duration. Facet-dependent indium incorporation of GaN/InGaN/GaN core-shell layers regrown onto the etched nanorods is observed by high-resolution cathodoluminescence imaging. Sharp features corresponding to diffracted wave-guide modes in angle-resolved photoluminescence measurements are evidence of the uniformity of the full core-shell structure grown on ordered etched nanorods.
| Original language | English |
|---|---|
| Article number | 094302 |
| Journal | Journal of Applied Physics |
| Volume | 114 |
| Issue number | 9 |
| Early online date | 3 Sept 2013 |
| DOIs | |
| Publication status | Published - 3 Sept 2013 |
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Dive into the research topics of 'Facet recovery and light emission from GaN/InGaN/GaN core-shell structures grown by metal organic vapour phase epitaxy on etched GaN nanorod arrays'. Together they form a unique fingerprint.Projects
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MC2-Electron Microscopy (EM)
Material and Chemical Characterisation (MC2)Facility/equipment: Technology type
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