Exponential Asymptotics for Thin Film Rupture

S. Jonathan Chapman, Philippe H. Trinh, Thomas P. Witelski

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)
Original languageEnglish
Pages (from-to)232-253
Number of pages22
JournalSIAM Journal on Applied Mathematics
Volume73
Issue number1
DOIs
Publication statusPublished - 1 Jan 2013

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