Original language | English |
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Pages (from-to) | 232-253 |
Number of pages | 22 |
Journal | SIAM Journal on Applied Mathematics |
Volume | 73 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1 Jan 2013 |
Exponential Asymptotics for Thin Film Rupture
S. Jonathan Chapman, Philippe H. Trinh, Thomas P. Witelski
Research output: Contribution to journal › Article › peer-review
15
Citations
(SciVal)