Experimental Tests of DC SFCL under Low Impedance and High Impedance Fault Conditions

Jiawen Xi, Xiaoze Pei, Wenjuan Song, Bin Xiang, Zhiyuan Liu, Xianwu Zeng

Research output: Contribution to journalArticlepeer-review

3 Citations (SciVal)
43 Downloads (Pure)

Abstract

DC system protection is more challenging than that for AC system due to the rapid rate of rise of the fault current and absence of natural current zero-crossing in DC systems. Superconducting fault current limiter (SFCL) in DC systems is a promising technology to reduce the fault current level and the rate of rise of the fault current, and also SFCLs have no resistance during normal operation. In this paper, the behaviors of an SFCL coil are investigated under both low impedance and high impedance fault conditions in DC systems. In the low impedance fault condition system, the SFCL coil performs effective limitation of the fault current level under different prospective fault current levels. The application of SFCLs with limited inductance in the DC system can be a potential solution to effectively suppress the fault current under low impedance short-circuit faults. The SFCL coil under the high impedance fault condition can only limit the prospective fault current when it is much higher than the critical current of the coil.

Original languageEnglish
Article number9376895
Pages (from-to)1-1
Number of pages1
JournalIEEE Transactions on Applied Superconductivity
Volume31
Issue number5
Early online date12 Mar 2021
DOIs
Publication statusPublished - 31 Aug 2021

Keywords

  • Capacitors
  • Circuit faults
  • Fault current limiters
  • Fault currents
  • Impedance
  • Inductance
  • Resistance
  • Yttrium barium copper oxide
  • power system protection
  • short-circuit currents
  • yttrium barium copper oxide (YBCO)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Experimental Tests of DC SFCL under Low Impedance and High Impedance Fault Conditions'. Together they form a unique fingerprint.

Cite this