Abstract
This paper has demonstrated a robust and simple technique to spatially resolve light emission from a vertical cavity surface emitting laser (VCSEL). The technique allows the mode structure, carrier density, and net cavity loss to be mapped. The measurements allow ready assessment of optical guiding in the structure. It is found that in larger area devices with low ohmic heating the guiding is dominated by free carrier effects.
Original language | English |
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Pages (from-to) | 439-440 |
Number of pages | 2 |
Journal | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
Volume | 2 |
Publication status | Published - 1 Dec 1995 |
Event | Proceedings of the 1995 8th Annual Meeting of the IEEE Lasers and Electro-Optics Society. Part 1 (of 2) - San Francisco, CA, USA Duration: 30 Oct 1995 → 2 Nov 1995 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering