TY - JOUR
T1 - Evaluation of planar 3D electrical capacitance tomography
T2 - From single-plane to dual-plane configuration
AU - Wei, Hsin-Yu
AU - Qiu, Chang-Hua
AU - Soleimani, Manuchehr
PY - 2015/4/30
Y1 - 2015/4/30
N2 - Electrical capacitance tomography (ECT) is a non-invasive imaging technique that is sensitive to the dielectric permittivity property of an object. Conventional ECT systems have a circular/cylindrical or rectangular geometry, in which the electrode plates are usually spaced equally around the tank. It is the most common configuration as it can be easily applied to industrial pipelines. However, under some circumstances, the full access to the imaging geometry may not be applicable due to the limitation of the process area. In those cases, and with limited access, planar ECT sensors can fit the process structure if access to only one side is possible. A single-plane ECT configuration has been proposed for such applications. However, the planar array often suffers from a lack of sensitivity and difficulty with depth detection. To better understand these limitations we investigate the imaging performance from the single-plane ECT to dual-plane ECT structure. The limitations and constraints of the planar configuration will also be discussed. Several experiments were conducted using both single-plane and dual-plane configurations to evaluate the potential applications. The initial results are promising, and the quality of the reconstructed images are compared with the real condition for process validation.
AB - Electrical capacitance tomography (ECT) is a non-invasive imaging technique that is sensitive to the dielectric permittivity property of an object. Conventional ECT systems have a circular/cylindrical or rectangular geometry, in which the electrode plates are usually spaced equally around the tank. It is the most common configuration as it can be easily applied to industrial pipelines. However, under some circumstances, the full access to the imaging geometry may not be applicable due to the limitation of the process area. In those cases, and with limited access, planar ECT sensors can fit the process structure if access to only one side is possible. A single-plane ECT configuration has been proposed for such applications. However, the planar array often suffers from a lack of sensitivity and difficulty with depth detection. To better understand these limitations we investigate the imaging performance from the single-plane ECT to dual-plane ECT structure. The limitations and constraints of the planar configuration will also be discussed. Several experiments were conducted using both single-plane and dual-plane configurations to evaluate the potential applications. The initial results are promising, and the quality of the reconstructed images are compared with the real condition for process validation.
KW - dual-plane ECT
KW - Electrical capacitance tomography
KW - planar array
KW - single-plane ECT
UR - http://www.scopus.com/inward/record.url?scp=84930001080&partnerID=8YFLogxK
U2 - 10.1088/0957-0233/26/6/065401
DO - 10.1088/0957-0233/26/6/065401
M3 - Article
AN - SCOPUS:84930001080
SN - 0957-0233
VL - 26
SP - 1
EP - 13
JO - Measurement Science and Technology
JF - Measurement Science and Technology
IS - 6
M1 - 065401
ER -