Evaluating the reduction in snubbing with soft-recovery devices and the effect of resistor inductance

Francis Robinson, Barry Williams

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The effects of current-fall shapes on RC-snubber performance are examined to determine if smaller snubbers that remain tolerant to varying current-fall shapes and durations and give lower power-losses can be used. The effects of component imperfections on RC-snubber performance, the optimization of RC-snubbers with nonabrupt current-falls, the sensitivity of nonabrupt snubbers to current-fall variations, and the energy losses associated with nonabrupt snubbers are discussed. It is shown that finely tuning RC-snubber components to take into account nonabrupt current fall, allows reduced snubber capacitance to be used under certain operating conditions. However, voltage-responses become more sensitive to current-fall shape, diode switching-loss is increased by several orders of magnitude, and there appears to be no significant energy-loss advantage with sinusoidally modulated current.
LanguageEnglish
Title of host publicationConference Record of the Industry Applications Society Annual Meeting
Place of PublicationSeattle, USA
PublisherIEEE
Pages1686-1694
Number of pages9
Volume2
ISBN (Print) 0-87942-553-9
DOIs
StatusPublished - 7 Oct 1990
Event1990 IEEE Industry Applications Society Annual Meeting - Seattle, USA United States
Duration: 7 Oct 199012 Oct 1990

Conference

Conference1990 IEEE Industry Applications Society Annual Meeting
CountryUSA United States
CitySeattle
Period7/10/9012/10/90

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Inductance
Resistors
Energy dissipation
Recovery
Diodes
Capacitance
Tuning
Defects
Electric potential

Cite this

Robinson, F., & Williams, B. (1990). Evaluating the reduction in snubbing with soft-recovery devices and the effect of resistor inductance. In Conference Record of the Industry Applications Society Annual Meeting (Vol. 2, pp. 1686-1694). Seattle, USA: IEEE. https://doi.org/10.1109/IAS.1990.152413

Evaluating the reduction in snubbing with soft-recovery devices and the effect of resistor inductance. / Robinson, Francis; Williams, Barry.

Conference Record of the Industry Applications Society Annual Meeting. Vol. 2 Seattle, USA : IEEE, 1990. p. 1686-1694.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Robinson, F & Williams, B 1990, Evaluating the reduction in snubbing with soft-recovery devices and the effect of resistor inductance. in Conference Record of the Industry Applications Society Annual Meeting. vol. 2, IEEE, Seattle, USA, pp. 1686-1694, 1990 IEEE Industry Applications Society Annual Meeting, Seattle, USA United States, 7/10/90. https://doi.org/10.1109/IAS.1990.152413
Robinson F, Williams B. Evaluating the reduction in snubbing with soft-recovery devices and the effect of resistor inductance. In Conference Record of the Industry Applications Society Annual Meeting. Vol. 2. Seattle, USA: IEEE. 1990. p. 1686-1694 https://doi.org/10.1109/IAS.1990.152413
Robinson, Francis ; Williams, Barry. / Evaluating the reduction in snubbing with soft-recovery devices and the effect of resistor inductance. Conference Record of the Industry Applications Society Annual Meeting. Vol. 2 Seattle, USA : IEEE, 1990. pp. 1686-1694
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