Electrons and holes in a 40 nm thick silicon slab at cryogenic temperatures

Kei Takashina, K Nishiguchi, Y Ono, A Fujiwara, T Fujisawa, Y Hirayama, K Muraki

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Abstract

We demonstrate low temperature operation of an electron-hole bilayer device based on a 40 nm thick layer of silicon in which electrons and holes can be simultaneously induced and contacted independently. The device allows the application of bias between the electrons and holes enhancing controllability over density and confining potential. We confirm that drag measurements are possible with the structure.
Original languageEnglish
Article number142104
Number of pages3
JournalApplied Physics Letters
Volume94
Issue number14
DOIs
Publication statusPublished - 6 Apr 2009

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cryogenic temperature
slabs
drag measurement
silicon
electrons
controllability
confining

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Takashina, K., Nishiguchi, K., Ono, Y., Fujiwara, A., Fujisawa, T., Hirayama, Y., & Muraki, K. (2009). Electrons and holes in a 40 nm thick silicon slab at cryogenic temperatures. Applied Physics Letters, 94(14), [142104]. https://doi.org/10.1063/1.3112602

Electrons and holes in a 40 nm thick silicon slab at cryogenic temperatures. / Takashina, Kei; Nishiguchi, K; Ono, Y; Fujiwara, A; Fujisawa, T; Hirayama, Y; Muraki, K.

In: Applied Physics Letters, Vol. 94, No. 14, 142104, 06.04.2009.

Research output: Contribution to journalArticle

Takashina, K, Nishiguchi, K, Ono, Y, Fujiwara, A, Fujisawa, T, Hirayama, Y & Muraki, K 2009, 'Electrons and holes in a 40 nm thick silicon slab at cryogenic temperatures', Applied Physics Letters, vol. 94, no. 14, 142104. https://doi.org/10.1063/1.3112602
Takashina K, Nishiguchi K, Ono Y, Fujiwara A, Fujisawa T, Hirayama Y et al. Electrons and holes in a 40 nm thick silicon slab at cryogenic temperatures. Applied Physics Letters. 2009 Apr 6;94(14). 142104. https://doi.org/10.1063/1.3112602
Takashina, Kei ; Nishiguchi, K ; Ono, Y ; Fujiwara, A ; Fujisawa, T ; Hirayama, Y ; Muraki, K. / Electrons and holes in a 40 nm thick silicon slab at cryogenic temperatures. In: Applied Physics Letters. 2009 ; Vol. 94, No. 14.
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