Effects of residual surface resistance on the microwave properties of YBCO thin films

A Porch, D W Huish, A V Velichko, M J Lancaster, J S Abell, A Perry, Darryl P Almond

Research output: Contribution to journalArticle

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)3706-3709
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume15
Issue number2 (Part 3)
DOIs
Publication statusPublished - Jun 2005

Cite this

Porch, A., Huish, D. W., Velichko, A. V., Lancaster, M. J., Abell, J. S., Perry, A., & Almond, D. P. (2005). Effects of residual surface resistance on the microwave properties of YBCO thin films. IEEE Transactions on Applied Superconductivity, 15(2 (Part 3)), 3706-3709. https://doi.org/10.1109/TASC.2005.849403