Effects of residual surface resistance on the microwave properties of YBCO thin films

A Porch; D W Huish; A V Velichko; M J Lancaster; J S Abell; A Perry; Darryl P Almond

doi:10.1109/TASC.2005.849403

Effects of residual surface resistance on the microwave properties of YBCO thin films

A Porch, D W Huish, A V Velichko, M J Lancaster, J S Abell, A Perry, Darryl P Almond

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

6 Citations (SciVal)

Original language	English
Pages (from-to)	3706-3709
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	15
Issue number	2 (Part 3)
DOIs	https://doi.org/10.1109/TASC.2005.849403
Publication status	Published - Jun 2005

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@article{7d7da0149ca74252bbf9219cd5348b55,

title = "Effects of residual surface resistance on the microwave properties of YBCO thin films",

author = "A Porch and Huish, {D W} and Velichko, {A V} and Lancaster, {M J} and Abell, {J S} and A Perry and Almond, {Darryl P}",

year = "2005",

month = jun,

doi = "10.1109/TASC.2005.849403",

language = "English",

volume = "15",

pages = "3706--3709",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "IEEE",

number = "2 (Part 3)",

}

TY - JOUR

T1 - Effects of residual surface resistance on the microwave properties of YBCO thin films

AU - Porch, A

AU - Huish, D W

AU - Velichko, A V

AU - Lancaster, M J

AU - Abell, J S

AU - Perry, A

AU - Almond, Darryl P

PY - 2005/6

Y1 - 2005/6

UR - http://dx.doi.org/10.1109/TASC.2005.849403

U2 - 10.1109/TASC.2005.849403

DO - 10.1109/TASC.2005.849403

M3 - Article

SN - 1051-8223

VL - 15

SP - 3706

EP - 3709

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 2 (Part 3)

ER -

Effects of residual surface resistance on the microwave properties of YBCO thin films

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