Edge effects and a method of defect sizing for transient thermography

Darryl P. Almond; S. K. Lau

doi:10.1063/1.109074

Edge effects and a method of defect sizing for transient thermography

Darryl P. Almond, S. K. Lau

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.

Original language	English
Article number	3369
Number of pages	3
Journal	Applied Physics Letters
Volume	62
Issue number	25
DOIs	https://doi.org/10.1063/1.109074
Publication status	Published - 21 Jun 1993

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title = "Edge effects and a method of defect sizing for transient thermography",

abstract = "Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.",

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year = "1993",

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AB - Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.

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Edge effects and a method of defect sizing for transient thermography

Abstract

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