Abstract
Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.
Original language | English |
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Article number | 3369 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 62 |
Issue number | 25 |
DOIs | |
Publication status | Published - 21 Jun 1993 |