Edge effects and a method of defect sizing for transient thermography

Darryl P. Almond, S. K. Lau

Research output: Contribution to journalArticle

Abstract

Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.
Original languageEnglish
Article number3369
Number of pages3
JournalApplied Physics Letters
Volume62
Issue number25
DOIs
Publication statusPublished - 21 Jun 1993

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