Edge effects and a method of defect sizing for transient thermography

Darryl P. Almond, S. K. Lau

Research output: Contribution to journalArticle

Abstract

Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.
LanguageEnglish
Article number3369
Number of pages3
JournalApplied Physics Letters
Volume62
Issue number25
DOIs
StatusPublished - 21 Jun 1993

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Edge effects and a method of defect sizing for transient thermography. / Almond, Darryl P.; Lau, S. K.

In: Applied Physics Letters, Vol. 62, No. 25, 3369, 21.06.1993.

Research output: Contribution to journalArticle

Almond, Darryl P. ; Lau, S. K./ Edge effects and a method of defect sizing for transient thermography. In: Applied Physics Letters. 1993 ; Vol. 62, No. 25.
@article{80b38beefd8a4fcfad590d41b0c51405,
title = "Edge effects and a method of defect sizing for transient thermography",
abstract = "Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.",
author = "Almond, {Darryl P.} and Lau, {S. K.}",
year = "1993",
month = "6",
day = "21",
doi = "10.1063/1.109074",
language = "English",
volume = "62",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "AIP Publishing",
number = "25",

}

TY - JOUR

T1 - Edge effects and a method of defect sizing for transient thermography

AU - Almond,Darryl P.

AU - Lau,S. K.

PY - 1993/6/21

Y1 - 1993/6/21

N2 - Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.

AB - Thermal edge effects for a cracklike defect have been calculated using the Wiener–Hopf technique. These have been used in an analytical model to explain transient thermographic image formation. The analysis has led to a simple method for defect sizing which is demonstrated using experimental results.

UR - http://dx.doi.org/10.1063/1.109074

U2 - 10.1063/1.109074

DO - 10.1063/1.109074

M3 - Article

VL - 62

JO - Applied Physics Letters

T2 - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 25

M1 - 3369

ER -