Edge-based finite-element analysis of the field patterns in V-shaped microshield line

M Lu, P J Leonard

Research output: Contribution to journalArticlepeer-review

12 Citations (SciVal)

Abstract

In this paper, field patterns in V-shaped microshield transmission line are calculated by using the edge-based finite element method. The dependence of the field patterns upon the thickness of metallic signal strip and the dielectric constant of dielectric substrate IS presented. The figures in this paper have important values in the design of microshield lines in microwave and millimeter-wave integrated circuits. (C) 2004 Wiley Periodicals. Inc.
Original languageEnglish
Pages (from-to)43-47
Number of pages5
JournalMicrowave and Optical Technology Letters
Volume41
Issue number1
DOIs
Publication statusPublished - 2004

Bibliographical note

ID number: ISI:000220208600016

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