Edge-based finite-element analysis of the field patterns in V-shaped microshield line

M Lu, P J Leonard

Research output: Contribution to journalArticle

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Abstract

In this paper, field patterns in V-shaped microshield transmission line are calculated by using the edge-based finite element method. The dependence of the field patterns upon the thickness of metallic signal strip and the dielectric constant of dielectric substrate IS presented. The figures in this paper have important values in the design of microshield lines in microwave and millimeter-wave integrated circuits. (C) 2004 Wiley Periodicals. Inc.
LanguageEnglish
Pages43-47
Number of pages5
JournalMicrowave and Optical Technology Letters
Volume41
Issue number1
DOIs
StatusPublished - 2004

Fingerprint

Millimeter waves
Integrated circuits
Electric lines
Permittivity
Microwaves
Finite element method
Substrates
millimeter waves
transmission lines
integrated circuits
strip
finite element method
permittivity
microwaves

Cite this

Edge-based finite-element analysis of the field patterns in V-shaped microshield line. / Lu, M; Leonard, P J.

In: Microwave and Optical Technology Letters, Vol. 41, No. 1, 2004, p. 43-47.

Research output: Contribution to journalArticle

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