eC-CLEM: flexible multidimensional registration software for correlative microscopies

Perrine Paul-Gilloteaux; Xavier Heiligenstein; Martin Belle; Marie-Charlotte Domart; Banafshe Larijani; Lucy Collinson; Graça Raposo; Jean Salamero

doi:10.1038/nmeth.4170

eC-CLEM: flexible multidimensional registration software for correlative microscopies

Perrine Paul-Gilloteaux, Xavier Heiligenstein, Martin Belle, Marie-Charlotte Domart, Banafshe Larijani, Lucy Collinson, Graça Raposo, Jean Salamero

Research output: Contribution to journal › Letter › peer-review

211 Citations (SciVal)

Original language	English
Pages (from-to)	102-103
Number of pages	2
Journal	Methods
Volume	14
Issue number	2
DOIs	https://doi.org/10.1038/nmeth.4170
Publication status	Published - 31 Jan 2017

Keywords

Electron Microscope Tomography/methods
Software

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10.1038/nmeth.4170

Cite this

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title = "eC-CLEM: flexible multidimensional registration software for correlative microscopies",

keywords = "Electron Microscope Tomography/methods, Software",

author = "Perrine Paul-Gilloteaux and Xavier Heiligenstein and Martin Belle and Marie-Charlotte Domart and Banafshe Larijani and Lucy Collinson and Gra{\c c}a Raposo and Jean Salamero",

year = "2017",

month = jan,

day = "31",

doi = "10.1038/nmeth.4170",

language = "English",

volume = "14",

pages = "102--103",

journal = "Methods",

issn = "1046-2023",

publisher = "Elsevier Academic Press Inc",

number = "2",

}

TY - JOUR

T1 - eC-CLEM

T2 - flexible multidimensional registration software for correlative microscopies

AU - Paul-Gilloteaux, Perrine

AU - Heiligenstein, Xavier

AU - Belle, Martin

AU - Domart, Marie-Charlotte

AU - Larijani, Banafshe

AU - Collinson, Lucy

AU - Raposo, Graça

AU - Salamero, Jean

PY - 2017/1/31

Y1 - 2017/1/31

KW - Electron Microscope Tomography/methods

KW - Software

UR - https://www.scopus.com/pages/publications/85011383043

U2 - 10.1038/nmeth.4170

DO - 10.1038/nmeth.4170

M3 - Letter

C2 - 28139674

SN - 1046-2023

VL - 14

SP - 102

EP - 103

JO - Methods

JF - Methods

IS - 2

ER -

eC-CLEM: flexible multidimensional registration software for correlative microscopies

Keywords

Access to Document

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Cite this