Dynamics of mode partitioning in vertical-cavity surface-emitting lasers

C. Mignosi, L. Raddatz, E. Dowd, I. H. White, D. G. Cunningham, M. R. Tan, S. Y. Wang

Research output: Contribution to journalConference article

Abstract

Time-resolved spatial measurements were carried out on multi-transverse mode vertical-cavity surface-emitting lasers (VCSEL). The dynamics of mode formation in top-emitting GaAs vertical-cavity surface-emitting lasers (VCSEL) was found including switching on time scales of a few nanoseconds, resulted from carrier diffusion effects rather than recombination. Carrier diffusion effects are found to be important in determining the modal dynamics before thermal effects become important. This mechanism affects the mode structure in a different manner than that resulting from thermally dependent effects that occur over longer time scales.

Original languageEnglish
Pages (from-to)270-271
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume11
Publication statusPublished - 1 Jan 1997
EventProceedings of the 1997 Conference on Lasers and Electro-Optics, CLEO - Baltimore, MD, USA
Duration: 18 May 199723 May 1997

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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