Direct Measurement of Cross-Phase Modulation in Microresonators

George N. Ghalanos; Jonathan M. Silver; Leonardo Del Bino; Niall P. Moroney; Michael T. M. Woodley; Andreas O. Svela; Shuangyou Zhang; Pascal Del'Haye

doi:10.1109/cleoe-eqec.2019.8872237

Direct Measurement of Cross-Phase Modulation in Microresonators

George N. Ghalanos
, Jonathan M. Silver
, Leonardo Del Bino
, Niall P. Moroney
, Michael T. M. Woodley
, Andreas O. Svela
, Shuangyou Zhang
, Pascal Del'Haye

Department of Physics

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

1 Citation (SciVal)

Abstract

The Kerr effect in microresonators is usually masked by thermal effects [1], as resonances can thermally drift on the order of a few GHz, compared to Kerr effect shifts of a few MHz. However, the Kerr effect, and in particular cross-phase modulation (XPM), is responsible for important effects seen in microresonators. For instance, it can be indirectly observed in solitons [2], as well as being the primary mechanism driving symmetry breaking of counter-propagating light in microresonators [3-5]. By direct measurement, the effective mode area can also be extracted by measuring the XPM-induced resonance shift.

Original language	English
Title of host publication	2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
Place of Publication	U. S. A.
Publisher	IEEE Xplore
Number of pages	1
ISBN (Electronic)	9781728104690
DOIs	https://doi.org/10.1109/cleoe-eqec.2019.8872237
Publication status	Published - 27 Jun 2019

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10.1109/cleoe-eqec.2019.8872237

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Direct Measurement of Cross-Phase Modulation in Microresonators. / Ghalanos, George N.; Silver, Jonathan M.; Bino, Leonardo Del et al.
2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC). U. S. A.: IEEE Xplore, 2019.

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

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title = "Direct Measurement of Cross-Phase Modulation in Microresonators",

abstract = "The Kerr effect in microresonators is usually masked by thermal effects [1], as resonances can thermally drift on the order of a few GHz, compared to Kerr effect shifts of a few MHz. However, the Kerr effect, and in particular cross-phase modulation (XPM), is responsible for important effects seen in microresonators. For instance, it can be indirectly observed in solitons [2], as well as being the primary mechanism driving symmetry breaking of counter-propagating light in microresonators [3-5]. By direct measurement, the effective mode area can also be extracted by measuring the XPM-induced resonance shift. ",

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doi = "10.1109/cleoe-eqec.2019.8872237",

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AU - Ghalanos, George N.

AU - Silver, Jonathan M.

AU - Bino, Leonardo Del

AU - Moroney, Niall P.

AU - Woodley, Michael T. M.

AU - Svela, Andreas O.

AU - Zhang, Shuangyou

AU - Del'Haye, Pascal

PY - 2019/6/27

Y1 - 2019/6/27

N2 - The Kerr effect in microresonators is usually masked by thermal effects [1], as resonances can thermally drift on the order of a few GHz, compared to Kerr effect shifts of a few MHz. However, the Kerr effect, and in particular cross-phase modulation (XPM), is responsible for important effects seen in microresonators. For instance, it can be indirectly observed in solitons [2], as well as being the primary mechanism driving symmetry breaking of counter-propagating light in microresonators [3-5]. By direct measurement, the effective mode area can also be extracted by measuring the XPM-induced resonance shift.

AB - The Kerr effect in microresonators is usually masked by thermal effects [1], as resonances can thermally drift on the order of a few GHz, compared to Kerr effect shifts of a few MHz. However, the Kerr effect, and in particular cross-phase modulation (XPM), is responsible for important effects seen in microresonators. For instance, it can be indirectly observed in solitons [2], as well as being the primary mechanism driving symmetry breaking of counter-propagating light in microresonators [3-5]. By direct measurement, the effective mode area can also be extracted by measuring the XPM-induced resonance shift.

UR - http://dx.doi.org/10.1109/cleoe-eqec.2019.8872237

U2 - 10.1109/cleoe-eqec.2019.8872237

DO - 10.1109/cleoe-eqec.2019.8872237

M3 - Chapter in a published conference proceeding

BT - 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

PB - IEEE Xplore

CY - U. S. A.

ER -

Direct Measurement of Cross-Phase Modulation in Microresonators

Abstract

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