Diffuse wall structure and narrow mesopores in highly crystalline MCM-41 materials studied by X-ray diffraction

Karen J. Edler, Philip A. Reynolds, John W. White, David Cookson

Research output: Contribution to journalArticle

105 Citations (Scopus)

Abstract

Synchrotron X-ray diffraction patterns for highly crystalline MCM-41 a mesoporous silicate molecular sieve are presented. The form factor observed in seven orders of diffraction is used to show the existence of a two-layer wall structure, with a narrower mesopore than previously assumed, and much void space in the walls.

Original languageEnglish
Pages (from-to)199-202
Number of pages4
JournalJournal of the Chemical Society - Faraday Transactions
Volume93
Issue number1
DOIs
Publication statusPublished - 7 Jan 1997

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Silicates
Molecular sieves
Synchrotrons
Diffraction patterns
Diffraction
Crystalline materials
X ray diffraction
absorbents
diffraction
form factors
voids
silicates
synchrotrons
x rays
diffraction patterns
MCM-41

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

Cite this

Diffuse wall structure and narrow mesopores in highly crystalline MCM-41 materials studied by X-ray diffraction. / Edler, Karen J.; Reynolds, Philip A.; White, John W.; Cookson, David.

In: Journal of the Chemical Society - Faraday Transactions, Vol. 93, No. 1, 07.01.1997, p. 199-202.

Research output: Contribution to journalArticle

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