Dichroic behavior of multilayer structures based on anisotropically nanostructured silicon

J Diener; N Kunzner; D Kovalev; E Gross; F Koch; M Fujii

doi:10.1063/1.1471581

Dichroic behavior of multilayer structures based on anisotropically nanostructured silicon

J Diener, N Kunzner, D Kovalev, E Gross, F Koch, M Fujii

Department of Physics

Research output: Contribution to journal › Article › peer-review

20 Citations (SciVal)

Abstract

Multilayer structures of anisotropically nanostructured (birefringent) silicon have been fabricated and studied by polarization-resolved reflection and transmission measurements. We demonstrate that stacks of birefringent porous silicon layers with alternating refractive indices and thicknesses act as dichroic Bragg reflectors or dichroic microcavities with a transmission/reflection dependent on the polarization direction of the incident light. The possibility of separate fine tuning of two orthogonally polarized transmission/reflection bands and their spectral splitting is demonstrated. (C) 2002 American Institute of Physics.

Original language	English
Pages (from-to)	6704-6709
Number of pages	6
Journal	Journal of Applied Physics
Volume	91
Issue number	10
DOIs	https://doi.org/10.1063/1.1471581
Publication status	Published - 2002

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abstract = "Multilayer structures of anisotropically nanostructured (birefringent) silicon have been fabricated and studied by polarization-resolved reflection and transmission measurements. We demonstrate that stacks of birefringent porous silicon layers with alternating refractive indices and thicknesses act as dichroic Bragg reflectors or dichroic microcavities with a transmission/reflection dependent on the polarization direction of the incident light. The possibility of separate fine tuning of two orthogonally polarized transmission/reflection bands and their spectral splitting is demonstrated. (C) 2002 American Institute of Physics.",

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AU - Diener, J

AU - Kunzner, N

AU - Kovalev, D

AU - Gross, E

AU - Koch, F

AU - Fujii, M

N1 - ID number: ISI:000175572500069

PY - 2002

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N2 - Multilayer structures of anisotropically nanostructured (birefringent) silicon have been fabricated and studied by polarization-resolved reflection and transmission measurements. We demonstrate that stacks of birefringent porous silicon layers with alternating refractive indices and thicknesses act as dichroic Bragg reflectors or dichroic microcavities with a transmission/reflection dependent on the polarization direction of the incident light. The possibility of separate fine tuning of two orthogonally polarized transmission/reflection bands and their spectral splitting is demonstrated. (C) 2002 American Institute of Physics.

AB - Multilayer structures of anisotropically nanostructured (birefringent) silicon have been fabricated and studied by polarization-resolved reflection and transmission measurements. We demonstrate that stacks of birefringent porous silicon layers with alternating refractive indices and thicknesses act as dichroic Bragg reflectors or dichroic microcavities with a transmission/reflection dependent on the polarization direction of the incident light. The possibility of separate fine tuning of two orthogonally polarized transmission/reflection bands and their spectral splitting is demonstrated. (C) 2002 American Institute of Physics.

U2 - 10.1063/1.1471581

DO - 10.1063/1.1471581

M3 - Article

SN - 0021-8979

VL - 91

SP - 6704

EP - 6709

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10

ER -

Dichroic behavior of multilayer structures based on anisotropically nanostructured silicon

Abstract

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