Determining the values of second-order surface nonlinearities by measurements with wave plates of different retardations

Ventsislav K. Valev, Stijn Foerier, Thierry Verbiest

Research output: Contribution to journalArticlepeer-review

Abstract

We measured the second harmonic generation response of a thin film consisting of chiral molecules with four wave plates having different retardation coefficients. By means of the fitting procedure described in a previously reported formalism, we demonstrated that a single set of tensor components of second order surface nonlinearities fits all the data. Our results provide clear experimental evidence for the validity of this method, which can find applications in the studies of chiral structures and achiral anisotropic materials.

Original languageEnglish
Pages (from-to)3030-3034
Number of pages5
JournalApplied Optics
Volume48
Issue number16
DOIs
Publication statusPublished - 1 Jun 2009

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