Abstract
The Poisson ratio. of In(2)O(3) has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO(2) substrates. The experimental results are in good agreement with values for. calculated using atomistic simulation procedures.
| Original language | English |
|---|---|
| Article number | 233301 |
| Journal | Physical Review B |
| Volume | 84 |
| Issue number | 23 |
| DOIs | |
| Publication status | Published - 1 Dec 2011 |
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