Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction

K H L Zhang, A Regoutz, R G Palgrave, D J Payne, R G Egdell, Aron Walsh, S P Collins, D Wermeille, R A Cowley

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Abstract

The Poisson ratio. of In(2)O(3) has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO(2) substrates. The experimental results are in good agreement with values for. calculated using atomistic simulation procedures.
Original languageEnglish
Article number233301
JournalPhysical Review B
Volume84
Issue number23
DOIs
Publication statusPublished - 1 Dec 2011

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Poisson ratio
Synchrotrons
Lattice constants
lattice parameters
synchrotrons
x ray diffraction
Diffraction
X rays
Thin films
Substrates
thin films
simulation

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Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., ... Cowley, R. A. (2011). Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction. Physical Review B, 84(23), [233301]. https://doi.org/10.1103/PhysRevB.84.233301

Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction. / Zhang, K H L; Regoutz, A; Palgrave, R G; Payne, D J; Egdell, R G; Walsh, Aron; Collins, S P; Wermeille, D; Cowley, R A.

In: Physical Review B, Vol. 84, No. 23, 233301, 01.12.2011.

Research output: Contribution to journalArticle

Zhang, KHL, Regoutz, A, Palgrave, RG, Payne, DJ, Egdell, RG, Walsh, A, Collins, SP, Wermeille, D & Cowley, RA 2011, 'Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction', Physical Review B, vol. 84, no. 23, 233301. https://doi.org/10.1103/PhysRevB.84.233301
Zhang, K H L ; Regoutz, A ; Palgrave, R G ; Payne, D J ; Egdell, R G ; Walsh, Aron ; Collins, S P ; Wermeille, D ; Cowley, R A. / Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction. In: Physical Review B. 2011 ; Vol. 84, No. 23.
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