The Poisson ratio. of In(2)O(3) has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO(2) substrates. The experimental results are in good agreement with values for. calculated using atomistic simulation procedures.
Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D., & Cowley, R. A. (2011). Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction. Physical Review B, 84(23), . https://doi.org/10.1103/PhysRevB.84.233301