Abstract
The Poisson ratio. of In(2)O(3) has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO(2) substrates. The experimental results are in good agreement with values for. calculated using atomistic simulation procedures.
Original language | English |
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Article number | 233301 |
Journal | Physical Review B |
Volume | 84 |
Issue number | 23 |
DOIs | |
Publication status | Published - 1 Dec 2011 |