| Original language | English |
|---|---|
| Pages (from-to) | 3620-3626 |
| Number of pages | 7 |
| Journal | physica status solidi c |
| Volume | 4 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - Sept 2007 |
Defect profiles in semiconductor structures
Research output: Contribution to journal › Article › peer-review
3
Citations
(SciVal)