Crack detection in dielectric objects using electrical capacitance tomography

Victoria J Stewart, Christopher J Budd, S Dorn, Manuchehr Soleimani

Research output: Chapter or section in a book/report/conference proceedingChapter in a published conference proceeding


Dielectric materials are becoming widely used because of their versatility and lowcost. Examples include carbon fibre, glass reinforced plastic, polymers and ceramics. These materials are increasingly used for aircraft structures and other important areas, such as transportation in gas pipelines, whose materials require regular inspection. There is a need for a new technology for rapid inspection of dielectric materials. This paper is focusing in one of the most challenging material inspection problems using an electrical capacitance tomography (EIT) system. We show that volume cracks could be detected using ECT data using state of the art shape reconstruction algorithm. The reconstruction of cracks is not possible using conventional image based approach that is used in the industrial process tomography application of ECT.

Original languageEnglish
Title of host publication6th World Congress in Industrial Process Tomography
PublisherInternational Society for Industrial Process Tomography
Number of pages8
ISBN (Print)9780853163220
Publication statusPublished - 2010
Event6th World Congress on Industrial Process Tomography (WCIPT6) - Beijing, China
Duration: 6 Sept 20109 Sept 2010


Conference6th World Congress on Industrial Process Tomography (WCIPT6)


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