Control theory for scanning probe microscopy revisited

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation.
Original languageEnglish
Pages (from-to)337-345
Number of pages9
JournalBeilstein Journal of Nanotechnology
Volume5
DOIs
Publication statusPublished - 21 Mar 2014

Keywords

  • AFM
  • control theory
  • feedback
  • scanning probe microscopy

Cite this

Control theory for scanning probe microscopy revisited. / Stirling, Julian.

In: Beilstein Journal of Nanotechnology, Vol. 5, 21.03.2014, p. 337-345.

Research output: Contribution to journalArticle

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