Compensating for motion artefacts in x-ray CT using electrical impedance tomography data

Research output: Contribution to conferencePaper

Original languageEnglish
Publication statusPublished - Sep 2010
Event6th World Congress on Industrial Process Tomography (WCIPT6) - Beijing, China
Duration: 6 Sep 20109 Sep 2010

Conference

Conference6th World Congress on Industrial Process Tomography (WCIPT6)
CountryChina
CityBeijing
Period6/09/109/09/10

Cite this

Pengpan, T., Mitchell, C. N., & Soleimani, M. (2010). Compensating for motion artefacts in x-ray CT using electrical impedance tomography data. Paper presented at 6th World Congress on Industrial Process Tomography (WCIPT6), Beijing, China.