Compensating for motion artefacts in x-ray CT using electrical impedance tomography data

Research output: Contribution to conferencePaperpeer-review

Original languageEnglish
Publication statusPublished - Sep 2010
Event6th World Congress on Industrial Process Tomography (WCIPT6) - Beijing, China
Duration: 6 Sep 20109 Sep 2010

Conference

Conference6th World Congress on Industrial Process Tomography (WCIPT6)
CountryChina
CityBeijing
Period6/09/109/09/10

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