Characterization of the interface region during the agglomeration of silicon nanocrystals in silicon dioxide

X D Pi, P G Coleman, R Harding, G Davies, R M Gwilliam

Research output: Contribution to journalArticle

14 Citations (Scopus)
Original languageEnglish
Pages (from-to)8155-8159
Number of pages5
JournalJournal of Applied Physics
Volume95
Issue number12
Publication statusPublished - 2004

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