Characterization of cadmium sulfide buffer layers using electrolyte contacts

Wentao Deng, Laurence Peter, Fabiana Lisco, Jake Bowers

Research output: Contribution to journalArticle

Abstract

Electrolyte contacts were used to characterize cadmium sulfide (CdS) films grown by chemical bath deposition on fluorine-doped tin oxide glass (FTO). Capacitance measurements were made in a buffered electrolyte free of redox species, and cyclic sweep voltammetry was carried out using an electrolyte containing Fe(CN) 6 4− ions. A theoretical model was developed to describe the influence of pinholes on Mott Schottky plots of CdS-coated FTO. The model allows estimation of the pinhole coverage by fitting the Mott Schottky plot over an extended voltage range. Cyclic voltammetry in a hexacyanoferrate(II) electrolyte also allows detection of pinholes, but quantitative estimation of pinhole coverage is complicated by the fact that diffusion of Fe(CN) 6 4− to pinholes occurs by hemispherical diffusion, which can substantially enhance the current response. Comparison of the results of capacitance and voltammetry measurements provides insights into average pore size and number density. Results presented for CdS films grown using two different chemical bath compositions reveal substantial differences in pinhole numbers and doping density.

Original languageEnglish
Pages (from-to)12-17
Number of pages6
JournalThin Solid Films
Volume671
Early online date15 Dec 2018
DOIs
Publication statusPublished - 1 Feb 2019

Keywords

  • Buffer layers
  • Cadmium sulfide
  • Fluorine-doped tin oxide glass
  • Mott Schottky
  • Photovoltaics
  • Pinholes
  • Solar cell
  • Voltammetry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Characterization of cadmium sulfide buffer layers using electrolyte contacts. / Deng, Wentao; Peter, Laurence; Lisco, Fabiana; Bowers, Jake.

In: Thin Solid Films, Vol. 671, 01.02.2019, p. 12-17.

Research output: Contribution to journalArticle

Deng, Wentao ; Peter, Laurence ; Lisco, Fabiana ; Bowers, Jake. / Characterization of cadmium sulfide buffer layers using electrolyte contacts. In: Thin Solid Films. 2019 ; Vol. 671. pp. 12-17.
@article{26b5b7a83b80463a829e68ee67501c13,
title = "Characterization of cadmium sulfide buffer layers using electrolyte contacts",
abstract = "Electrolyte contacts were used to characterize cadmium sulfide (CdS) films grown by chemical bath deposition on fluorine-doped tin oxide glass (FTO). Capacitance measurements were made in a buffered electrolyte free of redox species, and cyclic sweep voltammetry was carried out using an electrolyte containing Fe(CN) 6 4− ions. A theoretical model was developed to describe the influence of pinholes on Mott Schottky plots of CdS-coated FTO. The model allows estimation of the pinhole coverage by fitting the Mott Schottky plot over an extended voltage range. Cyclic voltammetry in a hexacyanoferrate(II) electrolyte also allows detection of pinholes, but quantitative estimation of pinhole coverage is complicated by the fact that diffusion of Fe(CN) 6 4− to pinholes occurs by hemispherical diffusion, which can substantially enhance the current response. Comparison of the results of capacitance and voltammetry measurements provides insights into average pore size and number density. Results presented for CdS films grown using two different chemical bath compositions reveal substantial differences in pinhole numbers and doping density.",
keywords = "Buffer layers, Cadmium sulfide, Fluorine-doped tin oxide glass, Mott Schottky, Photovoltaics, Pinholes, Solar cell, Voltammetry",
author = "Wentao Deng and Laurence Peter and Fabiana Lisco and Jake Bowers",
year = "2019",
month = "2",
day = "1",
doi = "10.1016/j.tsf.2018.12.024",
language = "English",
volume = "671",
pages = "12--17",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier",

}

TY - JOUR

T1 - Characterization of cadmium sulfide buffer layers using electrolyte contacts

AU - Deng, Wentao

AU - Peter, Laurence

AU - Lisco, Fabiana

AU - Bowers, Jake

PY - 2019/2/1

Y1 - 2019/2/1

N2 - Electrolyte contacts were used to characterize cadmium sulfide (CdS) films grown by chemical bath deposition on fluorine-doped tin oxide glass (FTO). Capacitance measurements were made in a buffered electrolyte free of redox species, and cyclic sweep voltammetry was carried out using an electrolyte containing Fe(CN) 6 4− ions. A theoretical model was developed to describe the influence of pinholes on Mott Schottky plots of CdS-coated FTO. The model allows estimation of the pinhole coverage by fitting the Mott Schottky plot over an extended voltage range. Cyclic voltammetry in a hexacyanoferrate(II) electrolyte also allows detection of pinholes, but quantitative estimation of pinhole coverage is complicated by the fact that diffusion of Fe(CN) 6 4− to pinholes occurs by hemispherical diffusion, which can substantially enhance the current response. Comparison of the results of capacitance and voltammetry measurements provides insights into average pore size and number density. Results presented for CdS films grown using two different chemical bath compositions reveal substantial differences in pinhole numbers and doping density.

AB - Electrolyte contacts were used to characterize cadmium sulfide (CdS) films grown by chemical bath deposition on fluorine-doped tin oxide glass (FTO). Capacitance measurements were made in a buffered electrolyte free of redox species, and cyclic sweep voltammetry was carried out using an electrolyte containing Fe(CN) 6 4− ions. A theoretical model was developed to describe the influence of pinholes on Mott Schottky plots of CdS-coated FTO. The model allows estimation of the pinhole coverage by fitting the Mott Schottky plot over an extended voltage range. Cyclic voltammetry in a hexacyanoferrate(II) electrolyte also allows detection of pinholes, but quantitative estimation of pinhole coverage is complicated by the fact that diffusion of Fe(CN) 6 4− to pinholes occurs by hemispherical diffusion, which can substantially enhance the current response. Comparison of the results of capacitance and voltammetry measurements provides insights into average pore size and number density. Results presented for CdS films grown using two different chemical bath compositions reveal substantial differences in pinhole numbers and doping density.

KW - Buffer layers

KW - Cadmium sulfide

KW - Fluorine-doped tin oxide glass

KW - Mott Schottky

KW - Photovoltaics

KW - Pinholes

KW - Solar cell

KW - Voltammetry

UR - http://www.scopus.com/inward/record.url?scp=85058961069&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2018.12.024

DO - 10.1016/j.tsf.2018.12.024

M3 - Article

VL - 671

SP - 12

EP - 17

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

ER -