Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

G Brauer; W Anwand; F Eichhorn; W Skorupa; C Hofer; C Teichert; J Kuriplach; J Cizek; I Prochazka; P G Coleman; T Nozawa; A Kohyama

Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

G Brauer, W Anwand, F Eichhorn, W Skorupa, C Hofer, C Teichert, J Kuriplach, J Cizek, I Prochazka, P G Coleman, T Nozawa, A Kohyama

Department of Physics

Research output: Contribution to journal › Article › peer-review

6 Citations (SciVal)

Original language	English
Pages (from-to)	3342-3351
Number of pages	10
Journal	Applied Surface Science
Volume	252
Issue number	9
Publication status	Published - 2006

Bibliographical note

ID number: ISI:000236021300042

Cite this

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title = "Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies",

author = "G Brauer and W Anwand and F Eichhorn and W Skorupa and C Hofer and C Teichert and J Kuriplach and J Cizek and I Prochazka and Coleman, {P G} and T Nozawa and A Kohyama",

note = "ID number: ISI:000236021300042",

year = "2006",

language = "English",

volume = "252",

pages = "3342--3351",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

number = "9",

}

TY - JOUR

T1 - Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

AU - Brauer, G

AU - Anwand, W

AU - Eichhorn, F

AU - Skorupa, W

AU - Hofer, C

AU - Teichert, C

AU - Kuriplach, J

AU - Cizek, J

AU - Prochazka, I

AU - Coleman, P G

AU - Nozawa, T

AU - Kohyama, A

N1 - ID number: ISI:000236021300042

PY - 2006

Y1 - 2006

M3 - Article

SN - 0169-4332

VL - 252

SP - 3342

EP - 3351

JO - Applied Surface Science

JF - Applied Surface Science

IS - 9

ER -