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Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

  • G Brauer
  • , W Anwand
  • , F Eichhorn
  • , W Skorupa
  • , C Hofer
  • , C Teichert
  • , J Kuriplach
  • , J Cizek
  • , I Prochazka
  • , P G Coleman
  • , T Nozawa
  • , A Kohyama

Research output: Contribution to journalArticlepeer-review

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Abstract

A SiC/SiC composite is characterized by X-ray diffraction, atomic force microscopy and various positron spectroscopies (slow positron implantation, positron lifetime and re-emission). It is found that besides its main constituent 3C–SiC the composite still must contain some graphite. In order to better interpret the experimental findings of the composite, a pyrolytic graphite sample was also investigated by slow positron implantation and positron lifetime spectroscopies. In addition, theoretical calculations of positron properties of graphite are presented.
Original languageEnglish
Pages (from-to)3342-3351
Number of pages10
JournalApplied Surface Science
Volume252
Issue number9
DOIs
Publication statusPublished - 2006

Bibliographical note

ID number: ISI:000236021300042

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