Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

G Brauer, W Anwand, F Eichhorn, W Skorupa, C Hofer, C Teichert, J Kuriplach, J Cizek, I Prochazka, P G Coleman, T Nozawa, A Kohyama

Research output: Contribution to journalArticlepeer-review

4 Citations (SciVal)
Original languageEnglish
Pages (from-to)3342-3351
Number of pages10
JournalApplied Surface Science
Issue number9
Publication statusPublished - 2006

Bibliographical note

ID number: ISI:000236021300042

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