Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

G Brauer, W Anwand, F Eichhorn, W Skorupa, C Hofer, C Teichert, J Kuriplach, J Cizek, I Prochazka, P G Coleman, T Nozawa, A Kohyama

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)3342-3351
Number of pages10
JournalApplied Surface Science
Volume252
Issue number9
Publication statusPublished - 2006

Cite this

Brauer, G., Anwand, W., Eichhorn, F., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T., & Kohyama, A. (2006). Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies. Applied Surface Science, 252(9), 3342-3351.