Characterization of a molecular sieve coating using ellipsometric porosimetry

S Eslava, M.R. Baklanov, C.E.A. Kirschhock, F. Iacopi, S. Aldea, K. Maex, J.A. Martens

Research output: Contribution to journalArticle

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Abstract

Ellipsometric porosimetry was used to determine the adsorption isotherms of toluene, methanol, and water on b-oriented Silicalite-1 coatings with a thickness of less than ca. 250 nm and to obtain adsorption kinetics. The adsorption isotherms are of sufficient quality to reveal several aspects of the pore structure such as the adsorbate capacity and the adsorbate/framework affinity. The use of a combination of different molecular probes in ellipsometric porosimetry to elucidate the molecular accessibility of Silicalite-1 pores is demonstrated. It is shown that ellipsometric porosimetry is an appropriate technique for probing the influence of aging of the Silicalite-1 coating and of planarization polishing on the porosity, pore accessibility, and adsorbate/framework affinity.
LanguageEnglish
Pages12811-12816
Number of pages6
JournalLangmuir
Volume23
Issue number26
DOIs
StatusPublished - 18 Dec 2007

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Molecular sieves
absorbents
Adsorbates
porosity
Adsorption isotherms
coatings
Coatings
adsorption
affinity
Molecular Probes
isotherms
Toluene
Pore structure
Polishing
Methanol
Porosity
Aging of materials
polishing
toluene
Adsorption

Cite this

Eslava, S., Baklanov, M. R., Kirschhock, C. E. A., Iacopi, F., Aldea, S., Maex, K., & Martens, J. A. (2007). Characterization of a molecular sieve coating using ellipsometric porosimetry. DOI: 10.1021/la7028388

Characterization of a molecular sieve coating using ellipsometric porosimetry. / Eslava, S; Baklanov, M.R.; Kirschhock, C.E.A.; Iacopi, F.; Aldea, S.; Maex, K.; Martens, J.A.

In: Langmuir, Vol. 23, No. 26, 18.12.2007, p. 12811-12816.

Research output: Contribution to journalArticle

Eslava, S, Baklanov, MR, Kirschhock, CEA, Iacopi, F, Aldea, S, Maex, K & Martens, JA 2007, 'Characterization of a molecular sieve coating using ellipsometric porosimetry' Langmuir, vol. 23, no. 26, pp. 12811-12816. DOI: 10.1021/la7028388
Eslava S, Baklanov MR, Kirschhock CEA, Iacopi F, Aldea S, Maex K et al. Characterization of a molecular sieve coating using ellipsometric porosimetry. Langmuir. 2007 Dec 18;23(26):12811-12816. Available from, DOI: 10.1021/la7028388
Eslava, S ; Baklanov, M.R. ; Kirschhock, C.E.A. ; Iacopi, F. ; Aldea, S. ; Maex, K. ; Martens, J.A./ Characterization of a molecular sieve coating using ellipsometric porosimetry. In: Langmuir. 2007 ; Vol. 23, No. 26. pp. 12811-12816
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