@inproceedings{8e1a85023fff4dedb366476914ce661d,
title = "Certify: A parameter extraction tool for power semiconductor device models",
abstract = "Characterization and validation is a crucial step for developing a valid model. Without characterization, a model is useless no matter how good it would be at depicting the behavior of a device. However, it is an extremely time-consuming process for a modeler to characterize a model by hand. This calls for an automated tool to facilitate the process. Certify, a parameter extraction tool, is developed for this purpose. It can create and store characterization recipes in which it is convenient for the user to set up experiments and reuse settings. In addition, multiple optimization algorithms are provided to greatly enhance and automate the characterization process.",
author = "W. Li and Y. Feng and Wilson, {P. R.} and Mantooth, {H. A.} and E. Santi and Hudgins, {J. L.}",
year = "2008",
language = "English",
isbn = "9781622763597",
series = "Summer Computer Simulation Conference 2008, SCSC 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008",
pages = "448--454",
booktitle = "Summer Computer Simulation Conference 2008, SCSC 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008",
note = "Summer Computer Simulation Conference 2008, SCSC 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008 ; Conference date: 16-06-2008 Through 19-06-2008",
}