Certify: A parameter extraction tool for power semiconductor device models

W Li; Y Feng; P. R. Wilson; H. A. Mantooth; E. Santi; J. L. Hudgins

Certify: A parameter extraction tool for power semiconductor device models

W Li, Y Feng, P. R. Wilson, H. A. Mantooth, E. Santi, J. L. Hudgins

Department of Electronic & Electrical Engineering

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

1 Citation (SciVal)

Abstract

Characterization and validation is a crucial step for developing a valid model. Without characterization, a model is useless no matter how good it would be at depicting the behavior of a device. However, it is an extremely time-consuming process for a modeler to characterize a model by hand. This calls for an automated tool to facilitate the process. Certify, a parameter extraction tool, is developed for this purpose. It can create and store characterization recipes in which it is convenient for the user to set up experiments and reuse settings. In addition, multiple optimization algorithms are provided to greatly enhance and automate the characterization process.

Original language	English
Title of host publication	Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008
Place of Publication	New York, U. S. A.
Publisher	Curran Associates
Pages	389-395
Number of pages	7
ISBN (Print)	9781622763603
Publication status	Published - 1 Dec 2008
Event	Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008 - Edinburgh, UK United Kingdom Duration: 16 Jun 2008 → 19 Jun 2008

Conference

Conference	Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008
Country/Territory	UK United Kingdom
City	Edinburgh
Period	16/06/08 → 19/06/08

ASJC Scopus subject areas

Modelling and Simulation

Cite this

Certify: A parameter extraction tool for power semiconductor device models. / Li, W; Feng, Y; Wilson, P. R. et al.
Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008. New York, U. S. A.: Curran Associates, 2008. p. 389-395.

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

Li, W, Feng, Y, Wilson, PR, Mantooth, HA, Santi, E & Hudgins, JL 2008, Certify: A parameter extraction tool for power semiconductor device models. in Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008. Curran Associates, New York, U. S. A., pp. 389-395, Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008, Edinburgh, UK United Kingdom, 16/06/08.

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abstract = "Characterization and validation is a crucial step for developing a valid model. Without characterization, a model is useless no matter how good it would be at depicting the behavior of a device. However, it is an extremely time-consuming process for a modeler to characterize a model by hand. This calls for an automated tool to facilitate the process. Certify, a parameter extraction tool, is developed for this purpose. It can create and store characterization recipes in which it is convenient for the user to set up experiments and reuse settings. In addition, multiple optimization algorithms are provided to greatly enhance and automate the characterization process.",

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T2 - Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008

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AU - Feng, Y

AU - Wilson, P. R.

AU - Mantooth, H. A.

AU - Santi, E.

AU - Hudgins, J. L.

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N2 - Characterization and validation is a crucial step for developing a valid model. Without characterization, a model is useless no matter how good it would be at depicting the behavior of a device. However, it is an extremely time-consuming process for a modeler to characterize a model by hand. This calls for an automated tool to facilitate the process. Certify, a parameter extraction tool, is developed for this purpose. It can create and store characterization recipes in which it is convenient for the user to set up experiments and reuse settings. In addition, multiple optimization algorithms are provided to greatly enhance and automate the characterization process.

AB - Characterization and validation is a crucial step for developing a valid model. Without characterization, a model is useless no matter how good it would be at depicting the behavior of a device. However, it is an extremely time-consuming process for a modeler to characterize a model by hand. This calls for an automated tool to facilitate the process. Certify, a parameter extraction tool, is developed for this purpose. It can create and store characterization recipes in which it is convenient for the user to set up experiments and reuse settings. In addition, multiple optimization algorithms are provided to greatly enhance and automate the characterization process.

UR - http://www.scopus.com/inward/record.url?scp=84870984617&partnerID=8YFLogxK

M3 - Chapter in a published conference proceeding

AN - SCOPUS:84870984617

SN - 9781622763603

SP - 389

EP - 395

BT - Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008

PB - Curran Associates

CY - New York, U. S. A.

Y2 - 16 June 2008 through 19 June 2008

ER -

Certify: A parameter extraction tool for power semiconductor device models

Abstract

Conference

ASJC Scopus subject areas

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