Certify

A parameter extraction tool for power semiconductor device models

W Li, Y Feng, P. R. Wilson, H. A. Mantooth, E. Santi, J. L. Hudgins

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Characterization and validation is a crucial step for developing a valid model. Without characterization, a model is useless no matter how good it would be at depicting the behavior of a device. However, it is an extremely time-consuming process for a modeler to characterize a model by hand. This calls for an automated tool to facilitate the process. Certify, a parameter extraction tool, is developed for this purpose. It can create and store characterization recipes in which it is convenient for the user to set up experiments and reuse settings. In addition, multiple optimization algorithms are provided to greatly enhance and automate the characterization process.

Original languageEnglish
Title of host publicationProceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008
Place of PublicationNew York, U. S. A.
PublisherCurran Associates
Pages389-395
Number of pages7
ISBN (Print)9781622763603
Publication statusPublished - 1 Dec 2008
EventGrand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008 - Edinburgh, UK United Kingdom
Duration: 16 Jun 200819 Jun 2008

Conference

ConferenceGrand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008
CountryUK United Kingdom
CityEdinburgh
Period16/06/0819/06/08

Fingerprint

Semiconductor device models
Parameter extraction
Semiconductor Devices
Model
Reuse
Optimization Algorithm
Valid
Power semiconductor devices
Experiment
Experiments

ASJC Scopus subject areas

  • Modelling and Simulation

Cite this

Li, W., Feng, Y., Wilson, P. R., Mantooth, H. A., Santi, E., & Hudgins, J. L. (2008). Certify: A parameter extraction tool for power semiconductor device models. In Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008 (pp. 389-395). New York, U. S. A.: Curran Associates.

Certify : A parameter extraction tool for power semiconductor device models. / Li, W; Feng, Y; Wilson, P. R.; Mantooth, H. A.; Santi, E.; Hudgins, J. L.

Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008. New York, U. S. A. : Curran Associates, 2008. p. 389-395.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, W, Feng, Y, Wilson, PR, Mantooth, HA, Santi, E & Hudgins, JL 2008, Certify: A parameter extraction tool for power semiconductor device models. in Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008. Curran Associates, New York, U. S. A., pp. 389-395, Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008, Part of the 2008 Summer Simulation Multiconference, SummerSim 2008, Edinburgh, UK United Kingdom, 16/06/08.
Li W, Feng Y, Wilson PR, Mantooth HA, Santi E, Hudgins JL. Certify: A parameter extraction tool for power semiconductor device models. In Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008. New York, U. S. A.: Curran Associates. 2008. p. 389-395
Li, W ; Feng, Y ; Wilson, P. R. ; Mantooth, H. A. ; Santi, E. ; Hudgins, J. L. / Certify : A parameter extraction tool for power semiconductor device models. Proceedings of Grand Challenges in Modeling and Simulation Symposium 2008, GCMS 2008. New York, U. S. A. : Curran Associates, 2008. pp. 389-395
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