Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models

Weifeng Li, Yongfeng Feng, Peter Wilson, Alan Mantooth, Enrico Santi, Jerry Hudgins

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

Original language	Undefined/Unknown
Title of host publication	Grand Challenges on Modeling and Simulation MS Net
Publication status	Published - 1 Jun 2008

Event Dates: June 2008

Cite this

@inproceedings{57655da1dc37489d9d75c9e1085ec947,

title = "Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models",

author = "Weifeng Li and Yongfeng Feng and Peter Wilson and Alan Mantooth and Enrico Santi and Jerry Hudgins",

note = "Event Dates: June 2008",

year = "2008",

month = jun,

day = "1",

language = "Undefined/Unknown",

booktitle = "Grand Challenges on Modeling and Simulation MS Net",

}

TY - GEN

T1 - Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models

AU - Li, Weifeng

AU - Feng, Yongfeng

AU - Wilson, Peter

AU - Mantooth, Alan

AU - Santi, Enrico

AU - Hudgins, Jerry

N1 - Event Dates: June 2008

PY - 2008/6/1

Y1 - 2008/6/1

UR - http://eprints.soton.ac.uk/265845/

M3 - Chapter in a published conference proceeding

BT - Grand Challenges on Modeling and Simulation MS Net

ER -