Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models

Weifeng Li, Yongfeng Feng, Peter Wilson, Alan Mantooth, Enrico Santi, Jerry Hudgins

Research output: Chapter or section in a book/report/conference proceedingChapter in a published conference proceeding

Original languageUndefined/Unknown
Title of host publicationGrand Challenges on Modeling and Simulation MS Net
Publication statusPublished - 1 Jun 2008

Bibliographical note

Event Dates: June 2008

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