Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models

Weifeng Li, Yongfeng Feng, Peter Wilson, Alan Mantooth, Enrico Santi, Jerry Hudgins

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationGrand Challenges on Modeling and Simulation MS Net
Publication statusPublished - 1 Jun 2008

Cite this

Li, W., Feng, Y., Wilson, P., Mantooth, A., Santi, E., & Hudgins, J. (2008). Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. In Grand Challenges on Modeling and Simulation MS Net

Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. / Li, Weifeng; Feng, Yongfeng; Wilson, Peter; Mantooth, Alan; Santi, Enrico; Hudgins, Jerry.

Grand Challenges on Modeling and Simulation MS Net. 2008.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, W, Feng, Y, Wilson, P, Mantooth, A, Santi, E & Hudgins, J 2008, Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. in Grand Challenges on Modeling and Simulation MS Net.
Li W, Feng Y, Wilson P, Mantooth A, Santi E, Hudgins J. Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. In Grand Challenges on Modeling and Simulation MS Net. 2008
Li, Weifeng ; Feng, Yongfeng ; Wilson, Peter ; Mantooth, Alan ; Santi, Enrico ; Hudgins, Jerry. / Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. Grand Challenges on Modeling and Simulation MS Net. 2008.
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