Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models

Weifeng Li, Yongfeng Feng, Peter Wilson, Alan Mantooth, Enrico Santi, Jerry Hudgins

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationGrand Challenges on Modeling and Simulation MS Net
Publication statusPublished - 1 Jun 2008

Cite this

Li, W., Feng, Y., Wilson, P., Mantooth, A., Santi, E., & Hudgins, J. (2008). Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. In Grand Challenges on Modeling and Simulation MS Net