Calibration of optically trapped nanotools

David M. Carberry; S.H. Simpson; James A. Grieve; Y. Wang; Henrik Schäfer; M. Steinhart; R. Bowman; Graham M. Gibson; Miles J. Padgett; S. Hanna; M J Miles

doi:10.1088/0957-4484/21/17/175501

Calibration of optically trapped nanotools

David M. Carberry, S.H. Simpson, James A. Grieve, Y. Wang, Henrik Schäfer, M. Steinhart, R. Bowman, Graham M. Gibson, Miles J. Padgett, S. Hanna, M J Miles

Research output: Contribution to journal › Article › peer-review

41 Citations (SciVal)

Abstract

Holographically trapped nanotools can be used in a novel form of force microscopy. By measuring the displacement of the tool in the optical traps, the contact force experienced by the probe can be inferred. In the following paper we experimentally demonstrate the calibration of such a device and show that its behaviour is independent of small changes in the relative position of the optical traps. Furthermore, we explore more general aspects of the thermal motion of the tool.

Original language	English
Article number	175501
Journal	Nanotechnology
Volume	21
Issue number	17
DOIs	https://doi.org/10.1088/0957-4484/21/17/175501
Publication status	Published - 6 Apr 2010

ASJC Scopus subject areas

Bioengineering
Chemistry(all)
Electrical and Electronic Engineering
Mechanical Engineering
Mechanics of Materials
Materials Science(all)

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10.1088/0957-4484/21/17/175501

Cite this

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AU - Carberry, David M.

AU - Simpson, S.H.

AU - Grieve, James A.

AU - Wang, Y.

AU - Schäfer, Henrik

AU - Steinhart, M.

AU - Bowman, R.

AU - Gibson, Graham M.

AU - Padgett, Miles J.

AU - Hanna, S.

AU - Miles, M J

PY - 2010/4/6

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AB - Holographically trapped nanotools can be used in a novel form of force microscopy. By measuring the displacement of the tool in the optical traps, the contact force experienced by the probe can be inferred. In the following paper we experimentally demonstrate the calibration of such a device and show that its behaviour is independent of small changes in the relative position of the optical traps. Furthermore, we explore more general aspects of the thermal motion of the tool.

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DO - 10.1088/0957-4484/21/17/175501

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JO - Nanotechnology

JF - Nanotechnology

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Calibration of optically trapped nanotools

Abstract

ASJC Scopus subject areas

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