Calibration of optically trapped nanotools

David M. Carberry, S.H. Simpson, James A. Grieve, Y. Wang, Henrik Schäfer, M. Steinhart, R. Bowman, Graham M. Gibson, Miles J. Padgett, S. Hanna, M J Miles

Research output: Contribution to journalArticlepeer-review

42 Citations (SciVal)


Holographically trapped nanotools can be used in a novel form of force microscopy. By measuring the displacement of the tool in the optical traps, the contact force experienced by the probe can be inferred. In the following paper we experimentally demonstrate the calibration of such a device and show that its behaviour is independent of small changes in the relative position of the optical traps. Furthermore, we explore more general aspects of the thermal motion of the tool.

Original languageEnglish
Article number175501
Issue number17
Publication statusPublished - 6 Apr 2010

ASJC Scopus subject areas

  • Bioengineering
  • General Chemistry
  • Electrical and Electronic Engineering
  • Mechanical Engineering
  • Mechanics of Materials
  • General Materials Science


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