Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

Julian Stirling; Gordon A Shaw

doi:10.3762/bjnano.4.2

Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

Julian Stirling
, Gordon A Shaw

Department of Physics

University of Nottingham
National Institute of Standards and Technology

Research output: Contribution to journal › Article › peer-review

5 Citations (SciVal)

Abstract

In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.

Original language	English
Pages (from-to)	10
Number of pages	1
Journal	Beilstein Journal of Nanotechnology
Volume	4
Issue number	10-19
DOIs	https://doi.org/10.3762/bjnano.4.2
Publication status	Published - 8 Jan 2013

Keywords

atomic force microscopy
force spectroscopy
lateral forces
mechanical vibrations

Access to Document

10.3762/bjnano.4.2

Cite this

@article{6998851694e642fea1e7f9fbaa0f0240,

title = "Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor",

abstract = "In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.",

keywords = "atomic force microscopy, force spectroscopy, lateral forces, mechanical vibrations",

author = "Julian Stirling and Shaw, \{Gordon A\}",

year = "2013",

month = jan,

day = "8",

doi = "10.3762/bjnano.4.2",

language = "English",

volume = "4",

pages = "10",

journal = "Beilstein Journal of Nanotechnology",

issn = "2190-4286",

publisher = "Beilstein-Institut Zur Forderung der Chemischen Wissenschaften",

number = "10-19",

}

TY - JOUR

T1 - Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

AU - Stirling, Julian

AU - Shaw, Gordon A

PY - 2013/1/8

Y1 - 2013/1/8

N2 - In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.

AB - In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.

KW - atomic force microscopy

KW - force spectroscopy

KW - lateral forces

KW - mechanical vibrations

U2 - 10.3762/bjnano.4.2

DO - 10.3762/bjnano.4.2

M3 - Article

SN - 2190-4286

VL - 4

SP - 10

JO - Beilstein Journal of Nanotechnology

JF - Beilstein Journal of Nanotechnology

IS - 10-19

ER -

Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

Abstract

Keywords

Access to Document

Fingerprint

Cite this