Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

Julian Stirling, Gordon A Shaw

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.
Original languageEnglish
Pages (from-to)10
Number of pages1
JournalBeilstein Journal of Nanotechnology
Volume4
Issue number10-19
DOIs
Publication statusPublished - 8 Jan 2013

Keywords

  • atomic force microscopy
  • force spectroscopy
  • lateral forces
  • mechanical vibrations

Cite this

Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor. / Stirling, Julian; Shaw, Gordon A.

In: Beilstein Journal of Nanotechnology, Vol. 4, No. 10-19, 08.01.2013, p. 10.

Research output: Contribution to journalArticle

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