Abstract
In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.
Original language | English |
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Pages (from-to) | 10 |
Number of pages | 1 |
Journal | Beilstein Journal of Nanotechnology |
Volume | 4 |
Issue number | 10-19 |
DOIs | |
Publication status | Published - 8 Jan 2013 |
Keywords
- atomic force microscopy
- force spectroscopy
- lateral forces
- mechanical vibrations