Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

A Sandhu; H Masuda; K Kurosawa; A Oral; S J Bending

Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

A Sandhu
, H Masuda
, K Kurosawa
, A Oral
, S J Bending

Department of Physics

Research output: Contribution to journal › Article › peer-review

24 Citations (SciVal)

Original language	English
Pages (from-to)	1335-1336
Number of pages	2
Journal	Electronics Letters
Volume	37
Issue number	22
Publication status	Published - 2001

Bibliographical note

ID number: ISI:000171943100013

Cite this

@article{543e952bf7544181aa1a238f5bb06c84,

title = "Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy",

author = "A Sandhu and H Masuda and K Kurosawa and A Oral and Bending, \{S J\}",

note = "ID number: ISI:000171943100013",

year = "2001",

language = "English",

volume = "37",

pages = "1335--1336",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "John Wiley \& Sons",

number = "22",

}

TY - JOUR

T1 - Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

AU - Sandhu, A

AU - Masuda, H

AU - Kurosawa, K

AU - Oral, A

AU - Bending, S J

N1 - ID number: ISI:000171943100013

PY - 2001

Y1 - 2001

M3 - Article

SN - 0013-5194

VL - 37

SP - 1335

EP - 1336

JO - Electronics Letters

JF - Electronics Letters

IS - 22

ER -