Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

A Sandhu, H Masuda, K Kurosawa, A Oral, S J Bending

Research output: Contribution to journalArticlepeer-review

23 Citations (SciVal)
Original languageEnglish
Pages (from-to)1335-1336
Number of pages2
JournalElectronics Letters
Issue number22
Publication statusPublished - 2001

Bibliographical note

ID number: ISI:000171943100013

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