Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

A Sandhu, H Masuda, K Kurosawa, A Oral, S J Bending

Research output: Contribution to journalArticle

22 Citations (Scopus)
Original languageEnglish
Pages (from-to)1335-1336
Number of pages2
JournalElectronics Letters
Volume37
Issue number22
Publication statusPublished - 2001

Cite this

Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy. / Sandhu, A; Masuda, H; Kurosawa, K; Oral, A; Bending, S J.

In: Electronics Letters, Vol. 37, No. 22, 2001, p. 1335-1336.

Research output: Contribution to journalArticle

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AU - Bending, S J

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