Original language | English |
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Pages (from-to) | 1335-1336 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 37 |
Issue number | 22 |
Publication status | Published - 2001 |
Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy
A Sandhu, H Masuda, K Kurosawa, A Oral, S J Bending
Research output: Contribution to journal › Article › peer-review
23
Citations
(SciVal)