Behavioural modelling of operational amplifier faults using VHDL-AMS

P. Wilson, J. Ross, M. Zwolinski, A. Brown, Y. Kilic

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of 2002 Design, Automation and Test in Europe Conference and Exhibition
PublisherIEEE
Pages1133
Number of pages1
ISBN (Print)9780769514710
DOIs
Publication statusPublished - 2002
EventDesign, Automation and Test in Europe Conference and Exhibition, 2002 - Paris, France
Duration: 4 Mar 20028 Mar 2002

Conference

ConferenceDesign, Automation and Test in Europe Conference and Exhibition, 2002
CountryFrance
CityParis
Period4/03/028/03/02

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