Behavioural modelling of operational amplifier faults using VHDL-AMS

P. Wilson, J. Ross, M. Zwolinski, A. Brown, Y. Kilic

Research output: Chapter or section in a book/report/conference proceedingChapter in a published conference proceeding

4 Citations (SciVal)
Original languageEnglish
Title of host publicationProceedings of 2002 Design, Automation and Test in Europe Conference and Exhibition
PublisherIEEE
Pages1133
Number of pages1
ISBN (Print)9780769514710
DOIs
Publication statusPublished - 2002
EventDesign, Automation and Test in Europe Conference and Exhibition, 2002 - Paris, France
Duration: 4 Mar 20028 Mar 2002

Conference

ConferenceDesign, Automation and Test in Europe Conference and Exhibition, 2002
Country/TerritoryFrance
CityParis
Period4/03/028/03/02

Cite this