Abstract
Ripeness is a crucial metric in the cultivation and sale of fruits. Current techniques for determining a fruit's ripeness rely on damaging, labour-intensive methods, providing only an approximation of crop-wide ripeness. A cost-effective, non-destructive ripeness detection method could provide instantaneous and accurate ripeness data whenever required, without generating wastage. This paper proposes a methodology for the measurement and estimation of banana ripeness using an array of low-cost sensing modalities. A 5-stage classification framework is proposed to classify bananas using a number of Machine Learning algorithms such as Support Vector Machines, Random Forest, K-Nearest Neighbours, Gradient Boosting Classifiers & Artificial Neural Networks. Datasets constructed from different combinations of sensor data were used for training and testing processes. The most accurate methods were Random Forest and Gradient Boosting Classifiers at 99.95 % each when using data from all available sensors.
Original language | English |
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Title of host publication | Proceedings of IEEE Sensors Conference 2024 |
Place of Publication | U. S. A. |
Publisher | IEEE |
Pages | 1-4 |
Number of pages | 4 |
ISBN (Electronic) | 9798350363517 |
ISBN (Print) | 9798350363524 |
DOIs | |
Publication status | Published - 17 Dec 2024 |
Event | IEEE Sensors 2024 - Kobe, Japan Duration: 20 Oct 2024 → 23 Oct 2024 https://ieeexplore.ieee.org/xpl/conhome/10783834/proceeding |
Conference
Conference | IEEE Sensors 2024 |
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Country/Territory | Japan |
City | Kobe |
Period | 20/10/24 → 23/10/24 |
Internet address |
Funding
Funders | Funder number |
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Engineering and Physical Sciences Research Council | EP/V051083/1 |
Keywords
- Training
- Support Vector Machine
- Accuracy
- artificial neural networks
- Boosting
- Real-time systems
- reliability
- Random Forest
- Testing
- Sensor arrays