Abstract

A system is described which makes possible the automated acquisition of resonance Raman spectra of a material as a function of excitation wavelength. The issues of wavelength accuracy, stabilization of the laser power, and control of the laser beam direction are discussed. Resonance Raman profiles of Raman spectra of Cd1-xMnxTe double quantum well heterostructures are presented to illustrate the wealth of detailed data that can be obtained in a routine fashion.

Original languageEnglish
Article number009
Pages (from-to)1080-1084
Number of pages5
JournalMeasurement Science and Technology
Volume4
Issue number10
DOIs
Publication statusPublished - 1 Dec 1993

ASJC Scopus subject areas

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics

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