Automated defect detection for pulsed transient thermography

S. G. Pickering, D. P. Almond

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The work presented in this paper evaluates a number of methods used to automate the defect detection process. One technique consists automatically evaluating the shape of thermal contrast curves to produce a Boolean defect image. Other techniques are based on curve fitting temperature-time data to test for deviations from the 1/√t thermal decay characteristic of defect free material. It has been found that this ideal behavior is not a feature of the characteristics of all samples using standard pulse thermography equipment.

Original languageEnglish
Title of host publicationReview of Progress in Quantitative Nondestructive Evaluation
Subtitle of host publicationVolume 26
EditorsD O Thompson, D E Chimenti
PublisherAmerican Institute of Physics
Pages1585-1592
Number of pages8
Volume26
Edition894
ISBN (Print)978-0-7354-0399-4
DOIs
Publication statusPublished - 2006
EventREVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION - Portland, OR, USA United States
Duration: 30 Jul 20064 Aug 2006

Publication series

NameAIP Conference Proceedings
Volume894
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceREVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION
CountryUSA United States
CityPortland, OR
Period30/07/064/08/06

Keywords

  • Non-destructive evaluation
  • Thermography

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Pickering, S. G., & Almond, D. P. (2006). Automated defect detection for pulsed transient thermography. In D. O. Thompson, & D. E. Chimenti (Eds.), Review of Progress in Quantitative Nondestructive Evaluation: Volume 26 (894 ed., Vol. 26, pp. 1585-1592). (AIP Conference Proceedings; Vol. 894). American Institute of Physics. https://doi.org/10.1063/1.2718154