Automated defect detection for pulsed transient thermography

Simon G Pickering, Darryl P Almond

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationReview of Progress in Quantitative Nondestructive Evaluation
EditorsD O Thompson, D E Chimenti
PublisherAmerican Institute of Physics
Pages1585-1599
Number of pages15
Volume26
Edition894
ISBN (Print)978-0-7354-0399-4
Publication statusPublished - 2006

Publication series

NameAIP Conference Proceedings
PublisherAmerican Institute of Physics

Cite this

Pickering, S. G., & Almond, D. P. (2006). Automated defect detection for pulsed transient thermography. In D. O. Thompson, & D. E. Chimenti (Eds.), Review of Progress in Quantitative Nondestructive Evaluation (894 ed., Vol. 26, pp. 1585-1599). (AIP Conference Proceedings). American Institute of Physics.