Automated critical device identification for configurable analogue transistors

Robert Rudolf, P. Taatizadeh, R. Wilcock, P. Wilson

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationDesign Automation & Test in Europe Conference aand Exhibition, 2012
PublisherIEEE
Pages858-861
Number of pages4
ISBN (Print)9781457721458
DOIs
Publication statusPublished - 1 Mar 2012
EventDesign Automation and Test in Europe Conference and Exhibition, 2012 - Dresden, Germany
Duration: 12 Mar 201216 Mar 2012

Conference

ConferenceDesign Automation and Test in Europe Conference and Exhibition, 2012
CountryGermany
CityDresden
Period12/03/1216/03/12

Cite this

Rudolf, R., Taatizadeh, P., Wilcock, R., & Wilson, P. (2012). Automated critical device identification for configurable analogue transistors. In Design Automation & Test in Europe Conference aand Exhibition, 2012 (pp. 858-861). IEEE. https://doi.org/10.1109/DATE.2012.6176616