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MC2-Electron Microscopy (EM)
Material and Chemical Characterisation (MC2)Facility/equipment: Technology type
C. X. Ren, B. Rouet-Leduc, J. T. Griffiths, E. Bohacek, M. J. Wallace, P. R. Edwards, M. A. Hopkins, D. W E Allsopp, M. J. Kappers, R. W. Martin, R. A. Oliver
Research output: Contribution to journal › Article › peer-review
Facility/equipment: Technology type