An objective comparison of pulsed, lock-in, and frequency modulated thermal wave imaging

K. Chatterjee; S. Tuli; S.G. Pickering; D.P. Almond

doi:10.1063/1.4716431

An objective comparison of pulsed, lock-in, and frequency modulated thermal wave imaging

K. Chatterjee, S. Tuli, S.G. Pickering, D.P. Almond

Department of Mechanical Engineering

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Abstract

An objective comparison of three different thermal non-destructive evaluation (NDE) techniques - pulsed thermography (PT), lock-in (LI) thermography, and frequency modulated thermal wave imaging (FMTWI), has been carried out on a CFRP sample. The matched energy comparison shows that on the basis of computed SNR, the shallow defects are better detected by PT, while deeper defects are detected equally by all techniques. © 2012 American Institute of Physics.

Original language	English
Pages (from-to)	1812-1815
Number of pages	4
Journal	AIP Conference Proceedings
Volume	1430
DOIs	https://doi.org/10.1063/1.4716431
Publication status	Published - 2012
Event	Review of Progress in Quantitative Nondestructive Evaluation - Burlington, VT, USA United States Duration: 16 Jul 2011 → 21 Jul 2011

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10.1063/1.4716431

Pickering 2012 AIP
Copyright (2012) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Chatterjee, K, Tuli, S, Pickering, SG & Almond, DP 2012, 'An objective comparison of pulsed, lock-in, and frequency modulated thermal wave imaging' AIP Conference Proceedings, vol 1430, pp. 1812-1815, and may be found at http://link.aip.org/link/doi/10.1063/1.4716431
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Cite this

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An objective comparison of pulsed, lock-in, and frequency modulated thermal wave imaging

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