An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb

D.P. Almond; S.G. Pickering

doi:10.1063/1.4716264

An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb

D.P. Almond, S.G. Pickering

Department of Mechanical Engineering

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Abstract

A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. © 2012 American Institute of Physics.

Original language	English
Pages (from-to)	467-474
Number of pages	8
Journal	AIP Conference Proceedings
Volume	1430
DOIs	https://doi.org/10.1063/1.4716264
Publication status	Published - 2012
Event	Review of Progress in Quantitative Nondestructive Evaluation - Burlington, VT, USA United States Duration: 16 Jul 2011 → 21 Jul 2011

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10.1063/1.4716264

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abstract = "A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. {\textcopyright} 2012 American Institute of Physics.",

author = "D.P. Almond and S.G. Pickering",

year = "2012",

doi = "10.1063/1.4716264",

language = "English",

volume = "1430",

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AU - Almond, D.P.

AU - Pickering, S.G.

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AB - A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. © 2012 American Institute of Physics.

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DO - 10.1063/1.4716264

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VL - 1430

SP - 467

EP - 474

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

T2 - Review of Progress in Quantitative Nondestructive Evaluation

Y2 - 16 July 2011 through 21 July 2011

ER -

An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb

Abstract

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