An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb

D.P. Almond, S.G. Pickering

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Abstract

A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. © 2012 American Institute of Physics.

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title = "An analytical study of the pulsed thermography defect detection limit and the defect aspect ratio greater than two rule-of-thumb",
abstract = "A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. {\circledC} 2012 American Institute of Physics.",
author = "D.P. Almond and S.G. Pickering",
year = "2012",
doi = "10.1063/1.4716264",
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N2 - A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. © 2012 American Institute of Physics.

AB - A simple modification of the one-dimensional expression for the thermal contrast of a layer provides an accurate prediction of peak contrast temperature and contrast peak time for defects of all aspect ratios. The analytical results have been shown to agree with numerical modelling. The rule-of-thumb is not generally valid as peak contrast is shown to depend critically on defect depth and absorbed excitation/flash energy as well as defect aspect ratio. © 2012 American Institute of Physics.

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